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Metallurgical Microscope
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  • Metallurgical Microscope

Metallurgical Microscope

  • Product description
  • Specifications
  • Metallurgical Microscope

    XJP120/130 Industry checking and measure microscopes are suitable to observe surfaces structure and

    geometry of workpiece. It is equipped excellent UIS optical system and modularization function design so

    that update system expediently and achieved polarization, dark field observation. Lift or down the optical

    and illumination unit along the leader to adjust the distance from stage to objective, so that enable using

    for different thickness workpiece. Quickly and effectively locate the observation part of workpiece by

    moving the mechanical stage. The motion of the focusing is roll that the roller bearing moved guiding

    the trigon slideway, so that the moving process is smooth. This is ideal optical instrument for checking

    and measure in the field of precision part, integrated circuit, packing material etc.


     

    Key words:
    • Metallurgical Microscope
  • Standard Configuration

    Specification

    Eyepiece

    Wide field WF10X(field number:¦µ22mm)  

    Infinity plan 

    achromatic 

    objective

    XJP-120

    Equipped with bright 

    field objectives

    PL L5X/0.12  (Work distance)26.1 mm

    PL L10X/0.25  (Work distance)20.2 mm

    PL L20X/0.40  (Work distance)8.80 mm

    PL L50X/0.70  (Work distance)3.68 mm

    XJP-130

    Equipped with bright & 

    dark field objectives

    PL L5X/0.12 BD  (Work distance)9.70 mm

    PL L10X/0.25 BD  (Work distance)9.30 mm

    PL L20X/0.40 BD (Work distance)7.23mm

    PL L50X/0.70 BD  (Work distance)2.50 mm

    Eyepieces tube

    Trinocular inclined 30˚, can be shot in 100% light flux.

    Epi- illumination 

    system

    XJP-120

    12V30W halogen and brightness enable control 

    XJP-130

    12V50W halogen and brightness enable control 

    Integrated field diaphragm, aperture diaphragm and 

    (Y,B,G, ground glass) switching device.

     Push-pull type analyzer and polarizer.

    Focus system

    Coaxial coarse/fine focus system, with coarse focus knob 

    tension adjustable device, minimum division of fine focusing: 1μm.

    Nosepiece

    Quintuple (Backward ball bearing inner locating)

    Working stage

    Base overall size300mmX240mm

    Mechanical stage overall size185mmX140mm£¬moving range

    Transersal :35mm£¬Longitudinal:30mm

    Optional accessories

    Eyepiece

    Wide field WF10X(field number:¦µ22mm)

    1122010

    Objective

    XJP-120

    PL L40X/0.60  

    (Work distance)3.98 mm

    2260140

    PL L60X/0.75  

    (Work distance)3.18 mm

    2260160

    PL L80X/0.80  

    (Work distance)1.25 mm

    2260180

    PL L100X/0.85  

    (Work distance)0.40 mm

    2260111

    XJP-130

    PL L40X/0.75 BD  

    (Work distance)3.04 mm

    2120140

    PL L60X/0.75 BD  

    (Work distance)1.90 mm

    2120160

    PL L80X/0.80 BD  

    (Work distance)0.80mm

    2120180

    PL L100X/0.85 BD  

    (Work distance)0.22 mm

    2120111

    CCD adapter

    0.4X

    810001

    0.5X

    810004

    1X 

    810002

    0.5Xwith dividing 0.1mm/Div

    810003

    Camera

    DV-1(with USB and Video output)

    800001

    DV-2(with USB output)

    800003

    DV-3(with Video output)

    800005

    Digital camera

    adapter

    CANON(EF), NIKON(F) 

    820001

     

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